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Volumn 392, Issue 1-3, 2004, Pages 276-280
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Erratum to 'Measurement of the Cotton-Mouton effect in krypton and xenon at 1064 nm with the PVLAS apparatus' [Chem. Phys. Lett. 392 (2004) 276] and 'A precise measurement of the Cotton-Mouton effect in neon' [Chem. Phys. Lett. 410 (2005) 288] (DOI:10.1016/j.cplett.2004.05.064);Measurement of the Cotton-Mouton effect in krypton and xenon at 1064 nm with the PVLAS apparatus
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Author keywords
[No Author keywords available]
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Indexed keywords
KRYPTON;
XENON;
ARTICLE;
BIREFRINGENCE;
MAGNETIC FIELD;
MAGNETISM;
MATHEMATICAL ANALYSIS;
SPECTRAL SENSITIVITY;
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EID: 2942685303
PISSN: 00092614
EISSN: None
Source Type: Journal
DOI: 10.1016/j.cplett.2009.06.094 Document Type: Erratum |
Times cited : (22)
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References (13)
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