|
Volumn 242, Issue , 2004, Pages 13-23
|
Imaging methods in atomic force microscopy.
a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CALIBRATION;
IMAGE PROCESSING;
INSTRUMENTATION;
METHODOLOGY;
SURFACE PROPERTY;
CALIBRATION;
IMAGE PROCESSING, COMPUTER-ASSISTED;
MICROSCOPY, ATOMIC FORCE;
SURFACE PROPERTIES;
|
EID: 2942683775
PISSN: 10643745
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (8)
|
References (0)
|