Enhancing tunability and decreasing temperature sensitivity

Materials Research Society Symposium - Proceedings

Volumn 784, Issue , 2003, Pages 405-410

  Tidrow, S C ^a   Tauber, A ^b   Potrepka, D M ^a   Crowne, F ^a   Rod, B ^a  

^a U S ARMY RESEARCH LABORATORY   (United States)

^b SCIENCE APPLICATIONS INTERNATIONAL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; FERROELECTRIC MATERIALS; MATERIALS SCIENCE; MICROWAVE DEVICES; PEROVSKITE; PHASE SHIFT; SUBSTITUTION REACTIONS;

ELECTRIC-FIELD TUNABLE DEVICES; ELECTRONIC SCANNING; TIME DELAY DEVICES; TUNABLE MICROWAVE DEVICES;

BARIUM COMPOUNDS;

EID: 2942677221     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-784-c8.20     Document Type: Conference Paper

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