|
Volumn 782, Issue , 2003, Pages 211-215
|
Localized, in-situ vacuum measurements for MEMS packaging
a a a a a a a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
CHIP CARRIERS;
HERMETIC PACKAGING;
VACUUM MEASUREMENTS;
CRYSTALS;
LIGHT REFLECTION;
OPTIMIZATION;
PACKAGING;
PHOTONS;
SEMICONDUCTOR DEVICES;
SILICON;
VACUUM;
MICROELECTROMECHANICAL DEVICES;
|
EID: 2942675109
PISSN: 02729172
EISSN: None
Source Type: Journal
DOI: 10.1557/proc-782-a5.32 Document Type: Article |
Times cited : (5)
|
References (5)
|