A novel MEA/AFM platform for measurement of real-time, nanometric morphological alterations of electrically stimulated neuroblastoma cells

IEEE Transactions on Nanobioscience

Volumn 3, Issue 2, 2004, Pages 111-117

  Shenai, Mahesh B ^a   Putchakayala, Krishna G ^b   Hessler, Jessica A ^b   Orr, Bradford G ^b   Holl, Mark M Banaszak ^b   Baker Jr , James R ^b  

^a UNIVERSITY OF MICHIGAN MEDICAL SCHOOL   (United States)

^b UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Atomic force microscopy (AFM); Electric stimulation; Microelectrode array (MEA); SH SY5Y

Indexed keywords

ATOMIC FORCE MICROSCOPY; BIOCHEMISTRY; DIFFRACTION; ELECTRIC CURRENTS; ELECTRON MICROSCOPY; IMAGING TECHNIQUES; MICROELECTRODES; MORPHOLOGY; OPTICAL MICROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICON; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRIC STIMULATION; MICROELECTRODE ARRAYS (MEA); NEUROBLASTOMA CELLS; NEURONAL MORPHOLOGY;

CELLS;

ARTICLE; ATOMIC FORCE MICROSCOPY; CELL LINE; CELL SIZE; CULTURE TECHNIQUE; CYTOLOGY; ELECTROSTIMULATION; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; HUMAN; INSTRUMENTATION; METHODOLOGY; MICROELECTRODE; NANOTECHNOLOGY; NERVE CELL; ONLINE SYSTEM; PHYSIOLOGY; RADIATION EXPOSURE; VALIDATION STUDY;

CELL CULTURE TECHNIQUES; CELL LINE; CELL SIZE; ELECTRIC STIMULATION; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; HUMANS; MICROELECTRODES; MICROSCOPY, ATOMIC FORCE; NANOTECHNOLOGY; NEURONS; ONLINE SYSTEMS;

EID: 2942674806     PISSN: 15361241     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNB.2004.828270     Document Type: Article

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