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Journal of Applied Physics

Volumn 95, Issue 11 II, 2004, Pages 7276-7278

Annealing effect on the Fe/Pt multilayers grown on Al2O 3 (0001) substrates

(7) Chou, S C a Yu, C C a Liou, Y a Yao, Y D a Wei, D H b Chin, T S b Tai, M F c

a INSTITUTE OF PHYSICS (Taiwan)

b NATIONAL TSING HUA UNIVERSITY (Taiwan)

c WUFENG INSTITUTE OF TECHNOLOGY (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ANNEALING; COERCIVE FORCE; CRYSTAL ORIENTATION; EPITAXIAL GROWTH; EVAPORATION; FUNCTIONS; IONS; MAGNETIC ANISOTROPY; MOLECULAR BEAM EPITAXY; MULTILAYERS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SUPERCONDUCTING TRANSITION TEMPERATURE; X RAY DIFFRACTION;

BILAYER THICKNESS; BUFFER LAYERS; POSTANNEALING TEMPERATURES; ULTRASONIC BATH;

IRON;

EID: 2942672503 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1687535 Document Type: Conference Paper

Times cited : (34)

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