![]() |
Volumn 95, Issue 11 I, 2004, Pages 6466-6469
|
Transformation strain by chemical disordering in silicon carbide
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CHEMICAL DISORDERING;
DENSITY FUNCTIONAL THEORY (DFT);
ELECTRONIC RELAXATION;
VOLUME EXPANSION;
AMORPHIZATION;
BOUNDARY CONDITIONS;
COMPUTER SIMULATION;
CRYSTALS;
ELECTRON IRRADIATION;
INFRARED SPECTROSCOPY;
INTERFACES (MATERIALS);
PROBABILITY DENSITY FUNCTION;
PROBABILITY DISTRIBUTIONS;
SHEAR STRESS;
STRESS RELAXATION;
SWELLING;
SILICON CARBIDE;
|
EID: 2942668304
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1690093 Document Type: Article |
Times cited : (14)
|
References (30)
|