Reduced dielectric dispersion in ferroelectric (Pb,La)TiO 3/(Pb,Ca)TiO3 thin-film multilayer heterostructures due to a mechanical stress relaxation mechanism

Applied Physics Letters

Volumn 84, Issue 21, 2004, Pages 4161-4163

  Poyato, Rosalía ^a   Calzada, M Lourdes ^a   Pardo, Lorena ^a  

^a INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC LOSSES; DIELECTRIC RELAXATION; DIFFUSION; HETEROJUNCTIONS; LATTICE CONSTANTS; MICROELECTROMECHANICAL DEVICES; MULTILAYERS; PERMITTIVITY; PEROVSKITE; PLASTIC DEFORMATION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SOL-GELS; STRESS RELAXATION; X RAY DIFFRACTION ANALYSIS;

GRAZING INCIDENCE X-RAY DIFFRACTION (GIXED) ANALYSIS; REMANENT POLARIZATION; TETRAGONAL DISTORTION; VACANCY DIFFUSION;

FERROELECTRIC THIN FILMS;

EID: 2942666205     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1755422     Document Type: Article

References (26)

1. Y. Ohya, T. Ito, and Y. Takahashi, Jpn. J. Appl. Phys., Part 1 33, 5272 (1994).
2. K. H. Yoon, J. H. Shin, J. H. Park, and D. H. Kang, J. Appl. Phys. 83, 3626 (1998).
3. L. L. Sun, O. K. Tan, W. G. Liu, W. G. Zhu, and X. Yao, Infrared Phys. Technol. 44, 177 (2003).
4. R. Poyato, J. Ricote, M. L. Calzada, and L. Pardo, Ferroelectrics 293, 209 (2003).
5. R. Poyato, M. L. Calzada, L. Pardo, J. García-López, and M. A. Respaldiza, J. Eur. Ceram. Soc. 24, 1615 (2004).
6. R. Poyato, M. L. Calzada, and L. Pardo, Appl. Phys. A (in press, on line from 1 August 2003, DOI: 10.1007/s00339-003-2238-x).
7. O. Auciello, J. F. Scott, and R. Ramesh, Phys. Today 51, 22 (1998).
8. C. A. Paz de Araujo, J. D. Cuchiaro, L. D. McMillan, M. C. Scott, and J. F. Scott, Nature (London) 374, 627 (1995).
9. A. L. Kholkin, V. V. Shvartsman, A. Yu. Emelyanov, R. Poyato, M. L. Calzada, and L. Pardo, Appl. Phys. Lett. 82, 2127 (2003).
10. V. V. Shvartsman, M. L. Calzada, R. Poyato, L. Pardo, and A. L. Kholkin, Ferroelectrics 295, 597 (2003).
11. M. Algueró, A. J. Bushby, M. J. Reece, R. Poyato, J. Ricote, M. L. Calzada, and L. Pardo, Appl. Phys. Lett. 79, 3830 (2001).
12. S. J. Lee, K. Y. Kang, and S. K. Han, Appl. Phys. Lett. 75, 1784 (1999).
13. S. J. Lee, S. E. Moon, W. J. Kim, and E. K. Kim, Integr. Ferroelectrics 37, 225 (2001).
14. Y. Wu, M. J. Forbess, S. Seraji, S. J. Limmer, T. P. Chou, and G. Cao, J. Appl. Phys. 89, 5647 (2001).
15. S. J. Lee, S. E. Moon, H. C. Ryu, M. H. Kwak, and Y. T. Kim, Jpn. J. Appl. Phys., Part 1 41, 4597 (2002).
16. B. Jiménez, A. Castro, L. Pardo, P. Millán, and R. Jiménez, J. Phys. Chem. Solids 62, 951 (2001).
17. B. Jiménez, R. Jiménez, A. Castro, P. Millán, and L. Pardo, J. Phys.: Condens. Matter 13, 7315 (2001).
18. R. Sirera and M. L. Calzada, Mater. Res. Bull. 30, 11 (1995).
19. M. L. Calzada, M. Algueró, and L. Pardo, J. Sol-Gel Sci. Technol. 13, 837 (1998).
20. H. P. Klug and L. E. Alexander, in X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials (Wiley, New York, 1954), p. 441.
21. M.-H. Zhao, R. Fu, D. Lu, and T.-Y. Zhang, Acta Mater. 50, 4241 (2002).
22. R. Levy-Tubiana, A. Baczmanski, and A. Lodini, Mater. Sci. Eng., A 341, 74 (2003).
23. R. Poyato, Ph.D. thesis. Univ. Autónoma de Madrid, 2003.
24. W. L. Warren, D. Dimos, G. E. Pike, K. Vanheusden, and R. Ramesh, Appl. Phys. Lett. 67, 1689 (1995).
25. W. L. Warren, G. E. Pike, K. Vanheusden, D. Dimos, and B. A. Tuttle, J. Appl. Phys. 79, 9250 (1996).
26. W. L. Warren, D. Dimos, G. E. Pike, B. A. Tuttle, M. V. Raymond, R. Ramesh, and T. J. Evans, Appl. Phys. Lett. 67, 866 (1995).