EDS X-ray investigation of interdiffusion in Au-Ni micro- and nanolayers

Microchimica Acta

Volumn 145, Issue 1-4, 2004, Pages 183-186

  Rakowska, Anna ^a,c   Filipek, Robert ^a   Sikorski, Krzysztof ^b   Danielewski, Marek ^a   Bachorczyk, Renata ^a  

^a AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

^b WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

^c INSTITUTE OF METALLURGY AND MATERIALS SCIENCE   (Poland)

Author keywords

Au Ni micro and nanolayers; Darken method; EDS microanalysis; Interdiffusion; XTFML correction program

Indexed keywords

GOLD; NICKEL;

ANALYTIC METHOD; CHEMICAL ANALYSIS; COMPARATIVE STUDY; CONCENTRATION (PARAMETERS); CONFERENCE PAPER; DIFFUSION; ELECTRON DIFFRACTION; MICROANALYSIS; NANOPARTICLE; RATING SCALE; THEORY; X RAY ANALYSIS;

EID: 2942651201     PISSN: 00263672     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00604-003-0150-x     Document Type: Conference Paper

References (13)

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