Atomic force microscope lithography in perovskite manganite La 0.8Ba 0.2MnO 3 films

Journal of Applied Physics

Volumn 95, Issue 11 II, 2004, Pages 7091-7093

  Li, Run Wei ^a   Kanki, Teruo ^a   Tohyama, Hide Aki ^a   Zhang, Jun ^a,b   Tanaka, Hidekazu ^a   Takagi, Akihiko ^a   Matsumoto, Takuya ^a   Kawai, Tomoji ^a  

^a OSAKA UNIVERSITY   (Japan)

^b UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NANOSIZED PATTERNS; PEROVSKITE MANGANITES; SCANNING PROBE MICROSCOPY (SPM);

ATOMIC FORCE MICROSCOPY; ELECTROCHEMISTRY; ETCHING; FRICTION; LANTHANUM COMPOUNDS; LITHOGRAPHY; NANOSTRUCTURED MATERIALS; OXIDATION; PASSIVATION; PEROVSKITE; SINGLE CRYSTALS; STRONTIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

THIN FILMS;

EID: 2942637846     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1690198     Document Type: Conference Paper

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