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Volumn 242, Issue , 2004, Pages 3-12
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How the atomic force microscope works.
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Author keywords
[No Author keywords available]
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Indexed keywords
ARTICLE;
ATOMIC FORCE MICROSCOPY;
HISTOLOGY;
INSTRUMENTATION;
METHODOLOGY;
SURFACE PROPERTY;
HISTOCYTOLOGICAL PREPARATION TECHNIQUES;
MICROSCOPY, ATOMIC FORCE;
SURFACE PROPERTIES;
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EID: 2942633965
PISSN: 10643745
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (7)
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References (0)
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