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Volumn 78, Issue 3-4, 2004, Pages 363-366

Inspection of periodically poled waveguide devices by confocal luminescence microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; ERBIUM ALLOYS; IMAGING TECHNIQUES; LUMINESCENCE; OPTIMIZATION; RAMAN SCATTERING; RAMAN SPECTROSCOPY; REFRACTIVE INDEX; SECOND HARMONIC GENERATION; SENSITIVITY ANALYSIS;

EID: 2942629968     PISSN: 09462171     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00340-003-1377-2     Document Type: Article
Times cited : (39)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.