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Volumn 78, Issue 3-4, 2004, Pages 363-366
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Inspection of periodically poled waveguide devices by confocal luminescence microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC FIELD EFFECTS;
ERBIUM ALLOYS;
IMAGING TECHNIQUES;
LUMINESCENCE;
OPTIMIZATION;
RAMAN SCATTERING;
RAMAN SPECTROSCOPY;
REFRACTIVE INDEX;
SECOND HARMONIC GENERATION;
SENSITIVITY ANALYSIS;
HIGH SPATIAL RESOLUTION;
LUMINESCENCE MICROSCOPY;
TOPOGRAPHICAL ARTIFACTS;
WAVEGUIDE DEVICES;
OPTICAL WAVEGUIDES;
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EID: 2942629968
PISSN: 09462171
EISSN: None
Source Type: Journal
DOI: 10.1007/s00340-003-1377-2 Document Type: Article |
Times cited : (39)
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References (19)
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