Copper-indium-gallium-diselenide/molybdenum layers analyzed by corrected SIMS depth profiles

Applied Surface Science

Volumn 231-232, Issue , 2004, Pages 804-807

  Bilger, G ^a   Grabitz, P O ^a   Strohm, A ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

Author keywords

Backside SIMS; Cascade mixing; CuIn 1 x Ga x Se 2 (CIGS); Depth profiling; Profile correction; Solar cells

Indexed keywords

DIFFUSION; INTERFACES (MATERIALS); MIXING; MOLYBDENUM COMPOUNDS; POLYCRYSTALLINE MATERIALS; SECONDARY ION MASS SPECTROMETRY; SOLAR CELLS; SOLAR RADIATION; SPUTTERING;

BACKSIDE SIMS; CASCADE MIXING; CUIN1-XGAXSE2 (CIGS); DEPTH PROFILING; PROFILE CORRECTION;

COPPER COMPOUNDS;

EID: 2942627410     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.03.077     Document Type: Conference Paper

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