A comparative study on detection of organic surface modifiers on mineral grains by TOF-SIMS, VUV SALI TOF-SIMS and VUV SALI with laser desorption

Applied Surface Science

Volumn 231-232, Issue , 2004, Pages 528-532

  Dimov, S S ^a   Chryssoulis, S L ^a  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

Author keywords

Laser desorption; Organic collectors; TOF SIMS; VUV SALI TOF SIMS

Indexed keywords

DESORPTION; HARMONIC ANALYSIS; IONIZATION; SECONDARY ION MASS SPECTROMETRY; SPUTTERING; ULTRAVIOLET RADIATION;

LASER DESORPTION; MOLECULAR IDENTIFICATION; ORGANIC COLLECTORS; TOF SIMS;

LASER APPLICATIONS;

EID: 2942625770     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.03.053     Document Type: Conference Paper

References (2)

1. Shi Y.J., Hu X.K., Dimov S.S., Lipson R. Anal. Chem. 70:1998;4534-4539.
2. Lykke K.R., et al. Appl. Opt. 32:1992;857-866.