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Volumn 36, Issue 8, 2004, Pages 26-28
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TIRF microscopy: The evanescent wave of the future
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Author keywords
[No Author keywords available]
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Indexed keywords
CELL MEMBRANES;
ELECTRIC FIELD EFFECTS;
ELECTROMAGNETIC FIELD EFFECTS;
FLUORESCENCE;
IMAGING TECHNIQUES;
LASER BEAM EFFECTS;
LIGHT REFLECTION;
PRISMS;
REFRACTIVE INDEX;
SURFACE PROPERTIES;
ANGLE OF INCIDENCE;
CRITICAL ANGLE;
DICHROMATIC MIRROR;
EVANESCENT WAVES;
LASE EXCITATION;
TOTAL INTERNAL REFLECTION FLUORESCENCE MICROSCOPY;
MICROSCOPIC EXAMINATION;
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EID: 2942624059
PISSN: 00447749
EISSN: None
Source Type: Trade Journal
DOI: None Document Type: Review |
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Times cited : (4)
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References (0)
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