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Volumn 42, Issue 12, 2004, Pages 2339-2356

Lower confidence bounds for CPU and CPL based on multiple samples with application to production yield assurance

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ASYMPTOTIC STABILITY; COMPUTATIONAL METHODS; CUSTOMER SATISFACTION; INFORMATION ANALYSIS; PROCESS CONTROL; SAMPLING;

EID: 2942620311     PISSN: 00207543     EISSN: None     Source Type: Journal    
DOI: 10.1080/00207540310001652888     Document Type: Article
Times cited : (6)

References (19)
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    • Chou, Y.M.1
  • 7
    • 0000446689 scopus 로고
    • On the distributions of the estimated process capability indices
    • CHOU, Y. M. and OWEN, D. B., 1989, On the distributions of the estimated process capability indices. Communication in Statistics: Theory and Methods, 18, 4549-4560.
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    • Chou, Y.M.1    Owen, D.B.2
  • 11
    • 0009937460 scopus 로고
    • Cumulative distribution function of the noncentral t distribution
    • LENTH, R. V., 1989, Cumulative distribution function of the noncentral t distribution. Applied Statistics, 38, 185-189.
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    • Lenth, R.V.1
  • 12
    • 0036891288 scopus 로고    scopus 로고
    • Testing process capability for one-sided specification limit with application to the voltage level translator
    • LIN, P. C. and PEARN, W. L., 2002, Testing process capability for one-sided specification limit with application to the voltage level translator. Microelectronics Reliability, 42(12), 1975-1983.
    • (2002) Microelectronics Reliability , vol.42 , Issue.12 , pp. 1975-1983
    • Lin, P.C.1    Pearn, W.L.2
  • 15
    • 0000853622 scopus 로고
    • Distributional and inferential properties of process capability indices
    • PEARN, W. L., KOTZ, S. and JOHNSON, N. L., 1992, Distributional and inferential properties of process capability indices. Journal of Quality Technology, 24, 216-231.
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    • Pearn, W.L.1    Kotz, S.2    Johnson, N.L.3
  • 16
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    • A reliable procedure for testing linear regulators with one-sided specification limits based on multiple samples
    • PEARN, W. L. and LIN, G. H., 2002, A reliable procedure for testing linear regulators with one-sided specification limits based on multiple samples. Microelectronics Reliability, 43, 651-664.
    • (2002) Microelectronics Reliability , vol.43 , pp. 651-664
    • Pearn, W.L.1    Lin, G.H.2
  • 18
    • 2942575353 scopus 로고    scopus 로고
    • Testing reliability assurance using capability indices C and C based on multiple samples with variable sample size
    • PEARN, W. L., SHU, M. H. and HSU, B. M., 2003, Testing reliability assurance using capability indices C and C based on multiple samples with variable sample size. Working paper.
    • (2003) Working Paper
    • Pearn, W.L.1    Shu, M.H.2    Hsu, B.M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.