A statistical approach to reporting uncertainty on certified values of chemical reference materials for trace metal analysis

Spectroscopy (Santa Monica)

Volumn 17, Issue 9, 2002, Pages 20-32

  Kocherlakota, Nimi ^a   Obenauf, Ralph ^b   Thomas, Robert ^c  

^a Certified Reference Materials Division   (United States)

^b SPEX CertiPrep ^*  (United States)

^c Scientific Solutions   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CERTIFICATE OF ANALYSIS; CERTIFIED REFERENCE MATERIALS (CRM); CERTIFIED VALUES; OPTICAL EMISSION SPECTROMETRY;

DATA REDUCTION; EMISSION SPECTROSCOPY; INDUCTIVELY COUPLED PLASMA; LIGHT EMISSION; MASS SPECTROMETRY; MATHEMATICAL MODELS; METAL ANALYSIS; TRACE ELEMENTS;

STANDARDS;

EID: 2942614943     PISSN: 08876703     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review

References (9)

1. ISO Guide 17025: Certification of Reference Materials, General and Statistical Principles (International Organization for Standardization/IEC, Geneva, Switzerland, 1999).
2. ASTM Guide D6362-98 (ASTM International, West Conshohocken, Pennsylvania, 2001).
3. ILAC-G21-2000 (International Laboratory Accreditation Cooperation, 2000).
4. ISO/REMCO N280 (International Organization for Standardization, Geneva, Switzerland).
5. S.L.R. Ellison, M. Rosslein, and A. Williams, Eurachem/CITAC Guide, Second Edition (Eurachem, 2000).
6. R. Watters and M. Levenson, ISO Guidelines for Uncertainty Calculations for Chemical Analysis (NCSL, Canada, 2000).
7. W. Aegsheider, "Method Validation and Measurement Uncertainty: Advanced Concepts in Analytical Quality Assurance," symposium at NIST, Washington DC, 2000.
8. B.N. Taylor and C.E. Kuyatt, NIST Technical Note 1297 (National Institute of Standards and Technology, Gaithersburg, Maryland, 1995).
9. Guide to the Expression of Uncertainty in Measurement; joint work group consisting of experts from BIPM, IEC, ISO, and OIML (1995).