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Volumn 61, Issue 2-3, 2004, Pages 307-311

Determination of parameters relevant to alpha spectrometry when employing source coating

Author keywords

Alpha spectrometry; Coating; Efficiency; Minimum level of detection; Resolution

Indexed keywords

COATINGS; CONTAMINATION; SPECTROMETRY; THIN FILMS;

EID: 2942612230     PISSN: 09698043     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apradiso.2004.03.026     Document Type: Conference Paper
Times cited : (18)

References (3)
  • 2
    • 0008317844 scopus 로고
    • Sources and prevention of recoil contamination of solid-state alpha detectors
    • Sill C.W., Olson D.G. Sources and prevention of recoil contamination of solid-state alpha detectors. Anal. Chem. 42(13):1970;1596-1607
    • (1970) Anal. Chem. , vol.42 , Issue.13 , pp. 1596-1607
    • Sill, C.W.1    Olson, D.G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.