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Volumn 61, Issue 2-3, 2004, Pages 307-311
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Determination of parameters relevant to alpha spectrometry when employing source coating
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Author keywords
Alpha spectrometry; Coating; Efficiency; Minimum level of detection; Resolution
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Indexed keywords
COATINGS;
CONTAMINATION;
SPECTROMETRY;
THIN FILMS;
ALPHA SPECTROMETRY;
MYLAR FILM COATINGS;
RECOIL FRAGMENTS;
RADIOISOTOPES;
CONFERENCE PAPER;
FILM;
MATERIAL COATING;
PRIORITY JOURNAL;
PRODUCTIVITY;
RADIOACTIVE CONTAMINATION;
SPECTROMETRY;
TECHNIQUE;
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EID: 2942612230
PISSN: 09698043
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apradiso.2004.03.026 Document Type: Conference Paper |
Times cited : (18)
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References (3)
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