Detection of sputtered molecular doubly charged anions: A comparison of secondary-ion mass spectrometry (SIMS) and accelerator mass spectrometry (AMS)

Applied Surface Science

Volumn 231-232, Issue , 2004, Pages 117-121

  Gnaser, Hubert ^a   Golser, Robin ^b   Kutschera, Walter ^b   Priller, Alfred ^b   Steier, Peter ^b   Vockenhuber, Christof ^b  

^a University of Koblenz Landau   (Germany)

^b UNIVERSITY OF VIENNA   (Austria)

Author keywords

AMS; Molecular dianions; SIMS; Sputtering

Indexed keywords

ELECTROSTATICS; MATHEMATICAL MODELS; MOLECULAR ORIENTATION; PARTICLE ACCELERATORS; SECONDARY ION MASS SPECTROMETRY; SPUTTERING; WAVE INTERFERENCE;

ACCELERATOR MASS SPECTROMETRY (AMS); AMS; MOLECULAR DIANIONS; SPUTTERED FLUX;

NEGATIVE IONS;

EID: 2942597871     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.03.084     Document Type: Conference Paper

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