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Volumn 137-140, Issue SPEC. ISS., 2004, Pages 325-328

Probabilities of double Auger processes upon the decay of the K-vacancy in neon

Author keywords

Double Auger process; Electron correlation; Vacancy decay

Indexed keywords

COMPUTATIONAL COMPLEXITY; CORRELATION METHODS; DATA REDUCTION; ELECTRON TRANSITIONS; ELECTROSTATICS; PHOTOIONIZATION; POLARIZATION; PROBABILITY;

DOUBLE AUGER PROCESS; ELECTRON CORRELATION; VACANCY DECAY;

AUGER ELECTRON SPECTROSCOPY;

EID: 2942594601 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/j.elspec.2004.02.070 Document Type: Conference Paper

Times cited : (11)

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