Soft x-ray XAFS experiments under atmospheric pressure at BL-4 in Ritsumeikan University

Physics and Chemistry of Glasses

Volumn 44, Issue 3, 2003, Pages 171-173

  Handa, K ^a   Ozutsumi, K ^a  

^a RITSUMEIKAN UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALKYL GROUP; PHOSPHATE; RADICAL; SILICATE;

ABSORPTION SPECTROSCOPY; ANALYTIC METHOD; ATMOSPHERIC PRESSURE; CHEMICAL BOND; CONFERENCE PAPER; CRYSTAL; ELECTRON BEAM; ENERGY; LIQUID; MEASUREMENT; PHOTON; ROENTGEN SPECTROSCOPY; X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY;

EID: 2942591293     PISSN: 00319090     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (8)

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2. Handa, K., Irie, M., Iwasaki, H., Ohtori, N. & Umesaki, N. Phys. Chem. Glasses, 2000, 41 (6), 345-8.
3. Dalba, G., Fornasini, P., Rocca, F. & Monti, F. Phys. Chem. Glasses, 2000, 41 (5), 290-5.
4. Kamijo, N. & Umesaki, N. Proc. Int. Conf. X-ray Absorption Fine Structure, Kobe, Jpn. J. Appl. Phys., 1993, 32, Suppl. 32-2, 658-60.
5. Handa, K. & Ozutsumi, K. In Memoirs of the SR Center Ritsumeikan University, 2002, 4, 11-14.
6. Yamamoto, Y., Sakai, I., Mitsuhashi, T., Amano, D. & Iwasaki, H. Nucl. Instrum. Meth. A, 2002, 480, 1-6.
7. Warren, B. E. In X-ray diffraction. 1990. Dover, New York. Pp 31-5.
8. McKale, A. D., Veal, B. W., Paulikas, A. P., Chan, S. K. & Knapp, G. S. J. Am. Chem. Soc., 1988, 110, 3763-8.