-
1
-
-
0037481079
-
Mechanism and kinetics of the allotropic transformation of tin
-
Burgers, W.G. and Green, L.J. (1957), “Mechanism and kinetics of the allotropic transformation of tin”, Faraday Soc. Discussions, Vol. 23, pp. 183-195.
-
(1957)
Faraday Soc. Discussions
, vol.23
, pp. 183-195
-
-
Burgers, W.G.1
Green, L.J.2
-
2
-
-
0036865862
-
Damage accumulation under repeated reverse stressing of Sn-Ag solder joints
-
Chen, K.C., Telang, A. and Lee, J.G. (2002), “Damage accumulation under repeated reverse stressing of Sn-Ag solder joints”, J. Electron. Mater., Vol. 31 No. 11, pp. 1181-1189.
-
(2002)
J. Electron. Mater.
, vol.31
, Issue.11
, pp. 1181-1189
-
-
Chen, K.C.1
Telang, A.2
Lee, J.G.3
-
3
-
-
0034767448
-
Lead-free reflow soldering for electronics assembly
-
Harrison, M., Vincent, J. and Steen, H.A.H. (2001), “Lead-free reflow soldering for electronics assembly”, Soldering and Surface Mount Technology, Vol. 13, pp. 21-38.
-
(2001)
Soldering and Surface Mount Technology
, vol.13
, pp. 21-38
-
-
Harrison, M.1
Vincent, J.2
Steen, H.A.H.3
-
4
-
-
0004086226
-
-
Edward Arnold Ltd London
-
Hedges, H.E. (1960), Tin and its Alloys, Edward Arnold Ltd, London, p. 51.
-
(1960)
Tin and its Alloys
, pp. 51
-
-
Hedges, H.E.1
-
5
-
-
0036607612
-
Surface damage accumulation in Sn-Ag solder joints under large reversed strains
-
Howell, J., Telang, A. and Lee, J.G. (2002), “Surface damage accumulation in Sn-Ag solder joints under large reversed strains”, J. Mater. Sci.: Mater. Electron., Vol. 13 No. 6, pp. 335-344.
-
(2002)
J. Mater. Sci.: Mater. Electron.
, vol.13
, Issue.6
, pp. 335-344
-
-
Howell, J.1
Telang, A.2
Lee, J.G.3
-
6
-
-
0032207630
-
Mechanical fatigue characteristics of Sn-3.5Ag-X (X=Bi, Cu, Zn and In) solder alloys
-
Kariya, Y. and Otsuka, M. (1998), “Mechanical fatigue characteristics of Sn-3.5Ag-X (X=Bi, Cu, Zn and In) solder alloys”, J. Electron. Mater., Vol. 27, pp. 1229-1235.
-
(1998)
J. Electron. Mater.
, vol.27
, pp. 1229-1235
-
-
Kariya, Y.1
Otsuka, M.2
-
7
-
-
0035112052
-
Tin pest in solder alloys
-
Kariya, Y., Gagg, C.R. and Plumbridge, W.J. (2001), “Tin pest in solder alloys”, Soldering and Surface Mount Technology, Vol. 13, pp. 39-40.
-
(2001)
Soldering and Surface Mount Technology
, vol.13
, pp. 39-40
-
-
Kariya, Y.1
Gagg, C.R.2
Plumbridge, W.J.3
-
8
-
-
0033222086
-
Effect of thermal cycles on the mechanical strength of quad flat pack leads/Sn-3.5Ag-X (X=Bi and Cu) solder joints
-
Kariya, Y., Hirata, Y. and Otsuka, M. (1999), “Effect of thermal cycles on the mechanical strength of quad flat pack leads/Sn-3.5Ag-X (X=Bi and Cu) solder joints”, J. Electron. Mater., Vol. 28, pp. 1261-1269.
-
(1999)
J. Electron. Mater.
, vol.28
, pp. 1261-1269
-
-
Kariya, Y.1
Hirata, Y.2
Otsuka, M.3
-
9
-
-
0036867034
-
Modeling thermomechanical fatigue behaviour of Sn-Ag Joints
-
Lee, J.G., Telang, A.U., Subramanian, K.N. and Bieler, T.R. (2002), “Modeling thermomechanical fatigue behaviour of Sn-Ag Joints”, J. Electron. Mater., Vol. 31, pp. 1152-1159.
-
(2002)
J. Electron. Mater.
, vol.31
, pp. 1152-1159
-
-
Lee, J.G.1
Telang, A.U.2
Subramanian, K.N.3
Bieler, T.R.4
-
10
-
-
0037395610
-
Damage produced in model (Sn-37Pb) joints during thermomechanical cycling
-
Liu, X.W. and Plumbridge, W.J. (2003), “Damage produced in model (Sn-37Pb) joints during thermomechanical cycling”, J. Electron. Mater., Vol. 32, pp. 278-286.
-
(2003)
J. Electron. Mater.
, vol.32
, pp. 278-286
-
-
Liu, X.W.1
Plumbridge, W.J.2
-
11
-
-
2942614958
-
Autodegradation of Sn-Ag-Cu alloys during thermal cycling
-
(in press).
-
Liu, X.W. and Plumbridge, W.J. (2004), “Autodegradation of Sn-Ag-Cu alloys during thermal cycling” (in press).
-
(2004)
-
-
Liu, X.W.1
Plumbridge, W.J.2
-
12
-
-
0032649115
-
Effects of strain rate and temperature on the stress-strain response of solder alloys
-
Plumbridge, W.J. and Gagg, C.R. (1999), “Effects of strain rate and temperature on the stress-strain response of solder alloys”, J. Mater. Sci.: Mater in Electron., Vol. 10, pp. 461-468.
-
(1999)
J. Mater. Sci.: Mater in Electron.
, vol.10
, pp. 461-468
-
-
Plumbridge, W.J.1
Gagg, C.R.2
-
13
-
-
2942588665
-
The influence of temperature on the creep of tin-37 lead solders
-
Columbus, OH
-
Plumbridge, W.J. and Gagg, C.R. (2002), “The influence of temperature on the creep of tin-37 lead solders”, invited paper to Symposium on Pb-free and Pb-bearing Solders, TMS Fall Meeting, Columbus, OH.
-
(2002)
invited paper to Symposium on Pb-free and Pb-bearing Solders, TMS Fall Meeting
-
-
Plumbridge, W.J.1
Gagg, C.R.2
-
15
-
-
0035454946
-
Creep of lead-free solders at elevated temperatures
-
Plumbridge, W.J., Gagg, C.R. and Peters, S. (2001), “Creep of lead-free solders at elevated temperatures”, J. Electron. Mater., Vol. 30, pp. 1178-1183.
-
(2001)
J. Electron. Mater.
, vol.30
, pp. 1178-1183
-
-
Plumbridge, W.J.1
Gagg, C.R.2
Peters, S.3
-
16
-
-
2942595959
-
The influence of processing history on the creep of tin-3.5 silver alloys
-
Yokohama
-
Plumbridge, W.J., Kariya, Y. and Gagg, C.R. (2001), “The influence of processing history on the creep of tin-3.5 silver alloys”, in, Seventh Symp. on Microjoining and Assembly Technology in Electronics, Yokohama, pp. 451-456.
-
(2001)
Seventh Symp. on Microjoining and Assembly Technology in Electronics
, pp. 451-456
-
-
Plumbridge, W.J.1
Kariya, Y.2
Gagg, C.R.3
-
17
-
-
2942555075
-
-
Kluwer, Dordrecht Boston, London
-
Plumbridge, W.J., Matela, R.J. and Westwater, A. (2003), Structural Integrity in Electronics-Enhancing Performance in a Lead-free Environment, Chapter 5, Kluwer, Dordrecht Boston, London.
-
(2003)
Structural Integrity in Electronics-Enhancing Performance in a Lead-free Environment
-
-
Plumbridge, W.J.1
Matela, R.J.2
Westwater, A.3
-
18
-
-
0004070609
-
-
DTI
-
Richards, B., Levogner, C.L., Hunt, C.P., Nimmo, K., Peters, S. and Cusack, P. (1999), Lead-free Soldering – An Analysis of the Current Status, DTI.
-
(1999)
Lead-free Soldering – An Analysis of the Current Status
-
-
Richards, B.1
Levogner, C.L.2
Hunt, C.P.3
Nimmo, K.4
Peters, S.5
Cusack, P.6
-
19
-
-
0033875279
-
Low cycle fatigue analysis of temperature and frequency effects in eutectic solder alloy
-
Shi, X.O., Pang, H.L.J., Zhou, W. and Wang, Z.P. (2000), “Low cycle fatigue analysis of temperature and frequency effects in eutectic solder alloy”, Int. J. Fatigue, Vol. 22, pp. 217-228.
-
(2000)
Int. J. Fatigue
, vol.22
, pp. 217-228
-
-
Shi, X.O.1
Pang, H.L.J.2
Zhou, W.3
Wang, Z.P.4
-
20
-
-
2942588666
-
Creep properties of Sn-8 mass per cent Zn-3 mass per cent Bi lead-free alloy
-
(in press).
-
Shoji, I., Gagg, C.R. and Plumbridge, W.J. (2004), “Creep properties of Sn-8 mass per cent Zn-3 mass per cent Bi lead-free alloy”, J. Electron. Mater.(in press).
-
(2004)
J. Electron. Mater.
-
-
Shoji, I.1
Gagg, C.R.2
Plumbridge, W.J.3
-
21
-
-
0038818002
-
Physical metallurgy in lead-free electronic solder development
-
Subramanian, K.N. and Lee, J.G. (2003), “Physical metallurgy in lead-free electronic solder development”, Journal of Metals, Vol. 55, pp. 26-32.
-
(2003)
Journal of Metals
, vol.55
, pp. 26-32
-
-
Subramanian, K.N.1
Lee, J.G.2
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