Fourier transform profilometry in 3-D measurement based on wavelet digital filter

Guangdianzi Jiguang/Journal of Optoelectronics Laser

Volumn 15, Issue 2, 2004, Pages 205-207

  Fu, Shuang ^a   Wang, Yun Shan ^a   Han, Guang Bing ^a   Si, Shu Chun ^a  

^a SHANDONG UNIVERSITY   (China)

Author keywords

Fourier transform profilometry; Spectrum overlapping; Wavelet transform

Indexed keywords

DIGITAL FILTERS; IMAGE PROCESSING; SPECTRUM ANALYSIS; SURFACE MEASUREMENT; THREE DIMENSIONAL; WAVELET TRANSFORMS;

FOURIER TRANSFORM PROFILOMETRY; SPECTRUM OVERLAPPING;

PROFILOMETRY;

EID: 2942571811     PISSN: 10050086     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (5)

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