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Volumn 53, Issue 3, 2004, Pages 847-853

An automatic detection scheme for periodic signals based on spectrum analyzer measurements

Author keywords

Harmonic distortion; Measurement; Nonlinearities; Signal detection; Spectrum analyzer; Statistics

Indexed keywords

ALGORITHMS; BANDWIDTH; FREQUENCIES; SIGNAL NOISE MEASUREMENT; SPECTRUM ANALYZERS;

EID: 2942569147     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2004.827091     Document Type: Article
Times cited : (11)

References (9)
  • 1
    • 0036543802 scopus 로고    scopus 로고
    • An automatic harmonic selection scheme for measurements and calibration with the nonlinear vectorial network analyzer
    • Apr.
    • W. Van Moer, Y. Rolain, and J. Schoukens, "An automatic harmonic selection scheme for measurements and calibration with the nonlinear vectorial network analyzer," IEEE Trans. Instrum. Meas., vol. 51, pp. 337-341, Apr. 2002.
    • (2002) IEEE Trans. Instrum. Meas. , vol.51 , pp. 337-341
    • Van Moer, W.1    Rolain, Y.2    Schoukens, J.3
  • 2
    • 0033677940 scopus 로고    scopus 로고
    • An automatic harmonic selection scheme for measurements and calibration with the nonlinear vectorial network analyzer
    • June
    • ____, "An automatic harmonic selection scheme for measurements and calibration with the nonlinear vectorial network analyzer," in IEEE Microwave Theory Tech. Dig., vol. III, June 2000, pp. 1858-1885.
    • (2000) IEEE Microwave Theory Tech. Dig. , vol.3 , pp. 1858-1885
    • Van Moer, W.1    Rolain, Y.2    Schoukens, J.3
  • 3
    • 0027989972 scopus 로고
    • Calibrated vectorial nonlinear network analyzer
    • San Diego, CA
    • T. Van den Broeck and J. Verspecht, "Calibrated vectorial nonlinear network analyzer," in IEEE-MTT-S Tech. Dig., San Diego, CA, 1994, pp. 1069-1072.
    • (1994) IEEE-MTT-S Tech. Dig. , pp. 1069-1072
    • Van Den Broeck, T.1    Verspecht, J.2
  • 7
    • 2942621290 scopus 로고    scopus 로고
    • Spectrum analyzer measurements and noise
    • Hewlett-Packard
    • "Spectrum Analyzer Measurements and Noise," Hewlett-Packard, 1998.
    • (1998)
  • 8
    • 2942555933 scopus 로고    scopus 로고
    • Detector selection for spectrum analyzer measurements
    • Feb.
    • J. Gorin, "Detector selection for spectrum analyzer measurements," RF Design, pp. 32-38, Feb. 2003.
    • (2003) RF Design , pp. 32-38
    • Gorin, J.1
  • 9
    • 2942563154 scopus 로고
    • HP 8390 Series Synthesized Sweepers
    • Hewlett-Packard
    • "HP 8390 Series Synthesized Sweepers," Hewlett-Packard, 1992.
    • (1992)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.