Characterization of surface structure by cluster coincidental ion mass spectrometry

Applied Surface Science

Volumn 231-232, Issue , 2004, Pages 106-112

  Rickman, R D ^a   Verkhoturov, S V ^a   Balderas, S ^a   Bestaoui, N ^a   Clearfield, A ^a   Schweikert, E A ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

Cluster SIMS; Coincidental ion mass spectrometry; Nanostructural characterization; Phase change; Zirconium phosphate

Indexed keywords

CRYSTALLINE MATERIALS; DATA REDUCTION; ENERGY DISSIPATION; FUNCTIONS; GELS; MASS SPECTROMETRY; STOICHIOMETRY; X RAY DIFFRACTION;

COINCIDENTAL ION MASS SPECTROMETRY; ION EMISSION; NANOSTRUCTURAL CHARACTERZATION; PHASE CHANGE; ZIRCONIUM PHOSPHATE;

SURFACE STRUCTURE;

EID: 2942567943     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.03.079     Document Type: Conference Paper

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