Oxygen isotopic tracer measurements in ceramics and ceramic composites with a fine focus gallium primary ion gun

Applied Surface Science

Volumn 231-232, Issue , 2004, Pages 834-839

  Chater, R J ^a   McPhail, D S ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

Ceramics; Gallium gun; Imaging SIMS; Isotopic; Oxygen

Indexed keywords

CERAMIC MATERIALS; HIGH TEMPERATURE APPLICATIONS; ION SOURCES; ISOTOPES; OXYGEN; POLYCRYSTALLINE MATERIALS; SECONDARY ION MASS SPECTROMETRY;

GALLIUM GUNS; IN-DEPTH DISTRIBUTIONS; ISOTOPIC TRACERS;

COMPOSITE MATERIALS;

EID: 2942567750     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.03.135     Document Type: Conference Paper

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