Application of TOF-SIMS to monitor coating processes on biological and organic surfaces

Applied Surface Science

Volumn 231-232, Issue , 2004, Pages 437-441

  Chatterjee, Reema ^a  

^a 3M COMPANY   (United States)

Author keywords

Biological surfaces; Cure kinetics; Monolayers; Organics; Polymers; Quantitation

Indexed keywords

ANTIBODIES; COATINGS; CURING; MONOLAYERS; REACTION KINETICS; SECONDARY ION MASS SPECTROMETRY;

BIOLOGICAL COATINGS; BIOLOGICAL SURFACES; CURE KINETICS; MONOLAYER COATINGS;

SURFACE TREATMENT;

EID: 2942558725     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.03.164     Document Type: Conference Paper

References (4)

1. J.C. Vickerman, D. Briggs (Eds.), TOF-SIMS Surface Analysis by Mass Spectrometry, Surface Spectra, IM Publications, 2001, pp. 497-650.
2. Wagner M.S., Castner D.G. Langmuir. 17:2001;4649-4660.
3. K.G. Lloyd, K.M. Stika, D.G. Swartzfager, Secondary ion mass spectrometry, in: G. Gillen, R. Lareau, J. Bennett, F. Stevie (Eds.), Proceedings of the 11th International Conference, Wiley, 1998, pp. 555-558.
4. J.K. Gates, K. Catmull, L. Goldstein, J. Livingston, Secondary ion mass spectrometry, in: G. Gillen, R. Lareau, J. Bennett, F. Stevie (Eds.), Proceedings of the 11th International Conference, Wiley, 1998, pp. 559-562.