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Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 65, Issue 5, 2002, Pages 527171-527178

Double photoionization of helium at an excess energy of 60 eV using left- and right-elliptically-polarized light

(13) Collins, S A a,b Cvejanovic S a Dawson, C a Reddish, T J a Seccombe, D P a Huetz, A c Malegat, L c Selles, P c Kazansky, A K d Danjo, A e Soejima, K e Okuno, K f Yagishita, A g

a NEWCASTLE UNIVERSITY (United Kingdom)

b FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT (Germany)

c INSTITUT DES SCIENCES MOLÉCULAIRES D ORSAY (France)

d ST PETERSBURG STATE UNIVERSITY (Russian Federation)

e NIIGATA UNIVERSITY (Japan)

f TOKYO METROPOLITAN UNIVERSITY (Japan)

g INSTITUTE OF MATERIALS STRUCTURE SCIENCE (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; ELECTRON EMISSION; ELECTRON ENERGY ANALYZERS; ELECTRON TRANSITIONS; GROUND STATE; IMPACT IONIZATION; LIGHT ABSORPTION; LIGHT POLARIZATION; MATRIX ALGEBRA; PHOTOIONIZATION; RELATIVITY; SPECTROMETERS; SYNCHROTRON RADIATION;

DOUBLE PHOTOIONIZATIONS (DPI); PHOTOELECTRON SPECTROMETERS;

HELIUM;

EID: 2942551446 PISSN: 10502947 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevA.65.052717 Document Type: Article

Times cited : (22)

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