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Journal of Microscopy

Volumn 214, Issue 3, 2004, Pages 328-333

High-resolution wide-field surface plasmon microscopy

(3) Stabler, G a Somekh, M G a See, C W a

a UNIVERSITY OF NOTTINGHAM (United Kingdom)

Author keywords

Grating; Spatial filter; Surface plasmon; Surface wave; Wide field

Indexed keywords

BANDPASS FILTERS; BEAMFORMING; IMAGE ENHANCEMENT; MICROSCOPES; SURFACE PLASMONS;

FOURIER; GRATING; GRATING STRUCTURES; HIGH RESOLUTION; IMAGE CONTRASTS; IMAGE PLANE; SPATIAL FILTERS; SURFACE-PLASMON; WIDE-FIELD; WIDE-FIELD SURFACE PLASMON MICROSCOPY;

SURFACE WAVES;

ANALYTIC METHOD; CONFERENCE PAPER; FOURIER ANALYSIS; IMAGING SYSTEM; MICROSCOPY; PRIORITY JOURNAL; SURFACE PLASMON RESONANCE; SURFACE PROPERTY;

EID: 2942547328 PISSN: 00222720 EISSN: None Source Type: Journal
DOI: 10.1111/j.0022-2720.2004.01309.x Document Type: Conference Paper

Times cited : (61)

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