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Volumn 95, Issue 10, 2004, Pages 5741-5745

Dielectric relaxation in interfacial amorphous phase of copper core-copper oxide shell nanocomposites in gel-derived silica glasses

(3) Basu, S a Das, D a Chakravorty, D a

a DEPARTMENT OF MATERIALS SCIENCE (India)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; DATA REDUCTION; DIELECTRIC RELAXATION; ELECTRON DIFFRACTION; FUSED SILICA; HYDROCHLORIC ACID; MICROSTRUCTURE; PH EFFECTS; SILICA GEL; TRANSMISSION ELECTRON MICROSCOPY;

AMBIENT CONDITIONS; EXPONENTIAL FUNCTIONS; MODULUS SPECTRA; PRECURSOR CHEMICALS;

NANOSTRUCTURED MATERIALS;

EID: 2942536370 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1702098 Document Type: Article

Times cited : (4)

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