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Volumn 19, Issue 6, 2004, Pages
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Analysis of thin AlN carrier exclusion layers in AlGaN/GaN microwave heterojunction field-effect transistors
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM NITRIDE;
CARRIER CONCENTRATION;
CURRENT DENSITY;
CURRENT VOLTAGE CHARACTERISTICS;
GALLIUM NITRIDE;
HETEROJUNCTIONS;
HOLE MOBILITY;
PRESSURE EFFECTS;
VAPOR PHASE EPITAXY;
CARRIER EXCLUSION LAYERS;
CONDUCTIVITY MEASUREMENTS;
DRIFT MOBILITY;
ROOM TEMPERATURE;
FIELD EFFECT TRANSISTORS;
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EID: 2942534094
PISSN: 02681242
EISSN: None
Source Type: Journal
DOI: 10.1088/0268-1242/19/6/L02 Document Type: Article |
Times cited : (33)
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References (13)
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