Electrical and morphological properties of composite films near the percolation threshold: Models of composite structures

Thin Solid Films

Volumn 459, Issue 1-2, 2004, Pages 174-177

  Hrach, Rudolf ^a,b   Švec, Martin ^a,b   Novák, Stanislav ^b   Sedlák, Dalibor ^a,b  

^a CHARLES UNIVERSITY   (Czech Republic)

^b J E PURKINJE UNIVERSITY   (Czech Republic)

Author keywords

Composite films; Electrical properties; Modelling; Morphological analysis

Indexed keywords

ALGORITHMS; COMPOSITE STRUCTURES; DIELECTRIC MATERIALS; ELECTRIC CONDUCTIVITY; METALLIC FILMS; MORPHOLOGY; STATISTICAL METHODS; TRANSMISSION ELECTRON MICROSCOPY;

COMPOSITE FILMS; MODELING; MORPHOLOGICAL ANALYSIS;

THIN FILMS;

EID: 2942529071     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.12.133     Document Type: Conference Paper

References (10)

1. Thurstans R.E., Taylor A.G., Oxley D.P., Biederman H., Martinu L. Vacuum. 35:1985;219.
2. Yoshida K. J. Phys. Soc. Jpn. 59:1990;4087.
3. Biederman H., Martinů L. Plasma Deposition, Treatment and Etching of Polymers. 1990;Academic Press, New York.
4. Bruschi P., Nannini A., Massara F. Thin Solid Films. 196:1991;201.
5. Canet P., Laurent C., Akinnifesi J., Despax B. J. Appl. Phys. 72:1992;2423.
6. Novák S., Sobotka M., Hrach R. Thin Solid Films. 373:2000;203.
7. Novák S., Hrach R. Czech. J. Phys. 52:2002;1389.
8. S. Novák, R. Hrach, Le Vide (2003), (in print).
9. Flouttard J.L., Akinnifesi J., Cambrill E., Despax B. J. Appl. Phys. 70:1991;798.
10. Staufer D. Introduction to Percolation Theory. 1985;1985 Taylor and Francis, London.