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Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

Scanning tunneling microscopy and spectroscopy of Na intercalation in VSe2

(5) Ekvall, I a Brauer, H E a Olin, H a Starnberg, H I a Wahlstrom E a

a CHALMERS UNIVERSITY OF TECHNOLOGY (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC ARRANGEMENT; CLEAN SURFACES; FLAT AREA; GAP STRUCTURES; IN-SITU; ROOM TEMPERATURE; SCANNING TUNNELING MICROSCOPES; SCANNING TUNNELING MICROSCOPY AND SPECTROSCOPY; TUNNELING SPECTRA; TUNNELING SPECTROSCOPY; VARIABLE TEMPERATURE;

CHARGE DENSITY WAVES; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPY; VACUUM; WIND TUNNELS;

SODIUM;

EID: 2942516806 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s003390051129 Document Type: Article

Times cited : (6)

References (17)

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