|
Volumn 7, Issue 6, 2005, Pages 3033-3037
|
Studies of ohmic contact and schottky barriers on Au-Ge/GaAs and Au-Ti/GaAs
|
Author keywords
GaAs (SI); Metal deposition; Ohmic contact; Schottky contact
|
Indexed keywords
BINARY ALLOYS;
CHEMICAL CLEANING;
ELECTRIC CONTACTORS;
ETCHING;
GALLIUM ARSENIDE;
GOLD ALLOYS;
HIGH ENERGY PHYSICS;
III-V SEMICONDUCTORS;
OHMIC CONTACTS;
RAPID THERMAL ANNEALING;
SCHOTTKY BARRIER DIODES;
SEMICONDUCTING GALLIUM;
SEMICONDUCTING GALLIUM ARSENIDE;
SEMICONDUCTING GERMANIUM;
SEMICONDUCTOR DOPING;
SILICON WAFERS;
SUBSTRATES;
THERMAL EVAPORATION;
VACUUM EVAPORATION;
X RAY DETECTORS;
CARRIER TRANSPORT MECHANISMS;
COMPOUND SEMICONDUCTORS;
GAAS;
HIGH SPEED DIGITAL CIRCUIT;
ILLUMINATION CONDITIONS;
METAL DEPOSITION;
RAPID THERMAL ANNEALING (RTA);
SCHOTTKY CONTACTS;
GOLD DEPOSITS;
|
EID: 29344462398
PISSN: 14544164
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (29)
|
References (18)
|