Wavelength and alignment tests for confocal spectral imaging systems

Microscopy Research and Technique

Volumn 68, Issue 5, 2005, Pages 307-319

  Zucker, Robert M ^a   Lerner, Jeremy M ^b  

^a U S ENVIRONMENTAL PROTECTION AGENCY   (United States)

^b LightForm Inc ^*  (United States)

Author keywords

Alignment; Confocal microscope; Leica; Olympus; PARISS; PMT; Quality assurance; Spectral calibration; Spectral imaging; Validation; Wavelength calibration; Zeiss

Indexed keywords

CALIBRATION; SPECTRUM ANALYZERS;

CONFOCAL MICROSCOPES; LEICUM; OLYMPUS; PARISS; PMT; SPECTRAL CALIBRATION; SPECTRAL IMAGING; VALIDATION; WAVELENGTH CALIBRATION; ZEISS;

QUALITY ASSURANCE;

ARGON; FLUORESCENT DYE; INORGANIC COMPOUND; MERCURY; PROTEIN;

ACCURACY; ANALYTICAL ERROR; ARTICLE; CALIBRATION; CONFOCAL MICROSCOPY; IMAGING SYSTEM; LIGHT; MODEL; PRIORITY JOURNAL; REPRODUCIBILITY; SPECTRAL SENSITIVITY; VALIDATION PROCESS;

EID: 29344456949     PISSN: 1059910X     EISSN: None     Source Type: Journal    
DOI: 10.1002/jemt.20249     Document Type: Article

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