A novel technique for localizing the scatterer in inverse profiling of two dimensional circularly symmetric dielectric scatterers using degree of symmetry and neural networks

Journal of Electromagnetic Waves and Applications

Volumn 19, Issue 15, 2005, Pages 2113-2121

  Thomas, V ^a   Gopakumar, C ^a   Yohannan, J ^a   Lonappan, A ^a   Bindu, G ^a   Kumar, A V Praveen ^a   Hamsakutty, V ^a   Mathew, K T ^a  

^a Department of Physics   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CONVERGENCE OF NUMERICAL METHODS; DEGREES OF FREEDOM (MECHANICS); MICROWAVES; NEURAL NETWORKS; PROBABILISTIC LOGICS; VECTORS;

PROBABILISTIC NEURAL NETWORK (PNN);

DIELECTRIC MATERIALS;

EID: 29344441262     PISSN: 09205071     EISSN: None     Source Type: Journal    
DOI: 10.1163/156939305775570477     Document Type: Article

References (12)

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