Cancer-radiotherapy equipment as a cause of soft errors in electronic equipment

IEEE Transactions on Device and Materials Reliability

Volumn 5, Issue 3, 2005, Pages 449-451

  Wilkinson, Jeffrey D ^a,b,d,e   Bounds, Chad ^a,b,f   Brown, Timothy ^a,b,g   Gerbi, Bruce J ^a,c,h   Peltier, Joel ^a,b,i  

^a IEEE   (United States)

^b MEDTRONIC INC   (United States)

^c UNIVERSITY OF MINNESOTA   (United States)

^d CRM Device Technology Group   (United States)

^e AAAS   (United States)

^f ICD Product Performance Group

^g Quality Group of Cardiac Rhythm Management

^h UNIVERSITY OF MINNESOTA MEDICAL SCHOOL   (United States)

ⁱ American National Standards Institute ANSI   (United States)

Author keywords

Biomedical applications of radiation; Boron; BPSG; Integrated circuit radiation effects; Neutron radiation effects; Radiotherapy; Single event upset; Soft errors

Indexed keywords

BIOMEDICAL APPLICATIONS OF RADIATION; BPSG; INTEGRATED CIRCUIT RADIATION EFFECTS; NEUTRON RADIATION EFFECTS; SINGLE EVENT UPSET; SOFT ERRORS;

BORON; DIELECTRIC MATERIALS; ELECTRONIC EQUIPMENT; INTEGRATED CIRCUITS; LINEAR ACCELERATORS; NEUTRONS; TUMORS;

RADIOTHERAPY;

EID: 29344435313     PISSN: 15304388     EISSN: 15304388     Source Type: Journal    
DOI: 10.1109/TDMR.2005.858342     Document Type: Article

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