Electronegativity model for barrier formation at metal/organic interfaces

Applied Physics Letters

Volumn 87, Issue 25, 2005, Pages 1-3

  Tang, J X ^a   Lee, C S ^a   Lee, S T ^a  

^a CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CHARGE; ELECTRODES; INTERFACES (MATERIALS); SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTING ORGANIC COMPOUNDS;

BARRIER FORMATION; ELECTRONEGATIVITY; METAL WORKS; WORK FUNCTION;

NEGATIVE RESISTANCE;

EID: 29244480003     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2149178     Document Type: Article

References (20)

1. C. W. Tang and S. A. VanSlyke, Appl. Phys. Lett. 51, 913 (1987).
2. J. X. Tang, Y. Q. Li, L. S. Hung, and C. S. Lee, Appl. Phys. Lett. 84, 73 (2004).
3. H. Ishii, K. Sugiyama, E. Ito, and K. Seki, Adv. Mater. (Weinheim, Ger.) 11, 605 (1999).
4. S. T. Lee, X. Y. Hou, M. G. Mason, and C. W. Tang, Appl. Phys. Lett. 72, 1593 (1998).
5. A. Kahn, N. Koch, and W. Gao, J. Polym. Sci., Part B: Polym. Phys. 41, 2529 (2003).
6. X. Crispin, V. Geskin, A. Crispin, J. Cornil, R. Lazzaroni, W. R. Salaneck, and J. L. Bredas, J. Am. Chem. Soc. 124, 8131 (2002).
7. Y. Li, N. J. Watkins, S. Zorba, Y. Gao, and C. W. Tang, Appl. Phys. Lett. 81, 2752 (2002).
8. A. M. Cowley and S. M. Sze, J. Appl. Phys. 36, 3212 (1965).
9. H. Vázquez, R. Oszwaldowski, P. Pou, J. Ortega, R. Ṕrez, F. Flores, and A. Kahn, Europhys. Lett. 65, 802 (2004).
10. J. X. Tang, C. S. Lee, S. T. Lee, and Y. B. Xu, Chem. Phys. Lett. 396, 92 (2004).
11. S. Kurtin, T. C. McGill, and C. A. Mead, Phys. Rev. Lett. 22, 1433 (1969).
12. W. Möch, J. Vac. Sci. Technol. B 17, 1867 (1999).
13. D. Ino, K. Watanabe, N. Takagi, and Y. Matsumoto, Phys. Rev. B 71, 115427 (2005).
14. H. Ishii, H. Oji, E. Ito, N. Hayashi, D. Yoshimura, and K. Seki, J. Lumin. 87-89, 61 (2000).
15. S. Narioka, H. Ishii, D. Yoshimura, M. Sei, Y. Ouchi, K. Seki, S. Hasegawa, T. Miyazaki, Y. Harima, and K. Yamashita, Appl. Phys. Lett. 67, 1899 (1995).
16. R. T. Tung, Phys. Rev. Lett. 84, 6078 (2000).
17. S. G. Louie and M. L. Cohen, Phys. Rev. B 13, 4408 (1976).
18. N. Koch, A. Kahn, J. Ghijsen, J.-J. Pireaux, J. Schwartz, R. L. Johnson, and A. Elschner, Appl. Phys. Lett. 82, 70 (2003).
19. P. S. Bagus, V. Staemmler, and C. Wöll, Phys. Rev. Lett. 89, 096104 (2002).
20. H. Peisert, M. Knupfer, F. Zhang, A. Petr, L. Dunsch, and J. Fink, Appl. Phys. Lett. 83, 3930 (2003).