A comparison study on the measurement of nanoparticles

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5879, Issue , 2005, Pages 1-6

  Wang, Chen Yu ^a   Pan, Shan Peng ^a   Peng, Gwo Sheng ^a   Tsai, Jen Hui ^a  

^a INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

Author keywords

Measurement comparison; Nanoparticle; Size characterization

Indexed keywords

ATOMIC FORCE MICROSCOPY; NANOSTRUCTURED MATERIALS; PROBLEM SOLVING; STANDARDIZATION; STANDARDS; TRANSMISSION ELECTRON MICROSCOPY;

FIELD-EMISSION TEM (FE-TEM); MEASUREMENT COMPARISON; PHOTON CORRELATION SPECTROSCOPY (PCS); SIZE CHARACTERIZATION;

MEASUREMENT THEORY;

EID: 29244452335     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.616440     Document Type: Conference Paper

References (8)

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