VECSEL threshold and output power-shutoff dependence on the carrier recombination rates

IEEE Photonics Technology Letters

Volumn 17, Issue 12, 2005, Pages 2511-2513

  Zakharian, Armis R ^a   Hader, J ^a   Moloney, J V ^a   Koch, S W ^b  

^a UNIVERSITY OF ARIZONA   (United States)

^b PHILIPPS UNIVERSITY MARBURG   (Germany)

Author keywords

Auger recombination; Optically pumped laser; Semiconductor microcavity; Vertical external cavity surface emitting laser (VECSEL)

Indexed keywords

COMPUTATIONAL METHODS; MATHEMATICAL MODELS; MIRRORS; OPTICAL PUMPING; PUMPING (LASER); REFRACTIVE INDEX;

AUGER RECOMBINATION; SEMICONDUCTOR MICROCAVITY; VERTICAL EXTERNAL CAVITY SURFACE EMITTING LASER (VECSEL);

SEMICONDUCTOR LASERS;

EID: 29244448674     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2005.858087     Document Type: Article

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