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Volumn 44, Issue 1, 2006, Pages 93-98

Depth gauging of defects using low frequency wideband Rayleigh waves

Author keywords

EMATs; Non destructive testing; Surface defect; Ultrasound

Indexed keywords

ACOUSTIC TRANSDUCERS; COMPUTER SIMULATION; CRACKS; FREQUENCY DOMAIN ANALYSIS; NONDESTRUCTIVE EXAMINATION; RAYLEIGH FADING; ULTRASONIC TESTING;

EID: 29244434065     PISSN: 0041624X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultras.2005.08.005     Document Type: Article
Times cited : (95)

References (25)
  • 23
    • 29244475542 scopus 로고    scopus 로고
    • R.S. Edwards, S. Dixon, X. Jian, submitted for publication
    • R.S. Edwards, S. Dixon, X. Jian, submitted for publication.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.