Phase-sensitive lock-in imaging of surface densities of states

Nanotechnology

Volumn 17, Issue 1, 2006, Pages 213-216

  Švec, Martin ^a   Mutombo, Pingo ^a   Shukrinov, Pavel ^a   Dudr, Viktor ^a   Cháb, Vladimír ^a  

^a INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTANCE; ELECTRONIC STRUCTURE; FERMI LEVEL; IMAGING TECHNIQUES; SCANNING TUNNELING MICROSCOPY;

DENSITY OF STATES; DYNAMIC CONDUCTANCE; UNIT CELL;

SURFACE PHENOMENA;

EID: 29144534075     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/17/1/035     Document Type: Article

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