DISCUS, a program for diffuse scattering and defect structure simulations - Update

Journal of Applied Crystallography

Volumn 32, Issue 4, 1999, Pages 838-839

  Proffen, Th ^a   Neder, R B ^b  

^a MICHIGAN STATE UNIVERSITY   (United States)

^b UNIVERSITY OF WÜRZBURG   (Germany)

Author keywords

Automatic structure determination; Patterson methods

Indexed keywords

EID: 29144528262     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889899004860     Document Type: Article

References (3)

1. Butler, B. D. & Welberry, T. R. (1992). J. Appl. Cryst. 25, 391-399.
2. Neder, R. B. & Proffen, Th. (1996). J. Appl. Cryst. 29, 727-735.
3. Proffen, Th. & Neder, R. B. (1997). J. Appl. Cryst. 30, 171-175.