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Volumn 1568, Issue , 1999, Pages 286-297

Measuring resemblance of complex patterns

Author keywords

[No Author keywords available]

Indexed keywords

PATTERN MATCHING;

EID: 29144523692     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/3-540-49126-0_22     Document Type: Conference Paper
Times cited : (2)

References (13)
  • 5
  • 6
    • 0004254001 scopus 로고
    • Cambridge University Press
    • E.T. Copson. Metric spaces. Cambridge University Press, 1968.
    • (1968) Metric Spaces
    • Copson, E.T.1
  • 7
    • 0030704370 scopus 로고    scopus 로고
    • A general method for partial point set matching
    • Jean-Daniel Boissonnat, editor, ACM Press
    • M. Hagedoorn and R. C. Veltkamp. A general method for partial point set matching. In Jean-Daniel Boissonnat, editor, Proc. 13th Annual ACM Symp. Computational Geometry, pages 406-408. ACM Press, 1997.
    • (1997) Proc. 13Th Annual ACM Symp. Computational Geometry , pp. 406-408
    • Hagedoorn, M.1    Veltkamp, R.C.2
  • 13
    • 0003758322 scopus 로고    scopus 로고
    • Efficient Visual Recognition Using the Hausdorff Distance
    • Springer-Verlag
    • W. Rucklidge. Efficient Visual Recognition Using the Hausdorff Distance. Lecture Notes in Computer Science. Springer-Verlag, 1996.
    • (1996) Lecture Notes in Computer Science
    • Rucklidge, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.