Measurement of inherent noise in EDA tools

Proceedings - International Symposium on Quality Electronic Design, ISQED

Volumn 2002-January, Issue , 2002, Pages 206-211

  Kahng, A B ^a   Mantik, S ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b University of California   (United States)

Author keywords

Computer science; Design methodology; Design optimization; Electronic design automation and methodology; Guidelines; Instruments; Noise measurement; Process design; Semiconductor device noise; Stability criteria

Indexed keywords

COMPUTER AIDED DESIGN; COMPUTER SCIENCE; ELECTRONIC DESIGN AUTOMATION; INSTRUMENTS; OPTIMIZATION; PROCESS DESIGN; PRODUCT DESIGN; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICES; STABILITY CRITERIA;

DESIGN METHODOLOGY; DESIGN OPTIMIZATION; ELECTRONIC DESIGN AUTOMATION AND METHODOLOGIES; GUIDELINES; NOISE MEASUREMENTS; SEMICONDUCTOR DEVICE NOISE;

DESIGN;

EID: 29144514966     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2002.996731     Document Type: Conference Paper

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