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Volumn 48, Issue 6, 2005, Pages 826-828

A chamber for X-ray diffractometry of gas hydrates samples for pressures of up to 700 atm

Author keywords

[No Author keywords available]

Indexed keywords

GASKETS; LOW TEMPERATURE EFFECTS; PLASTIC PRODUCTS; PRESSURE EFFECTS; SYNCHROTRON RADIATION; X RAY DIFFRACTION;

EID: 29144506831     PISSN: 00204412     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10786-005-0146-3     Document Type: Article
Times cited : (1)

References (4)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.