A model of high resolution cross strip readout for photon and ion counting imaging detectors

IEEE Transactions on Nuclear Science

Volumn 52, Issue 5 III, 2005, Pages 1755-1759

  Tremsin, Anton S ^a,b   Siegmund, Oswald H W ^b   Vallerga, John V ^b  

^a IEEE   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Image resolution; Photon detectors; Position sen sitive detectors

Indexed keywords

IMAGE RESOLUTION; PHOTON DETECTORS; POSITIVE SEN-SITIVE DETECTORS;

AMPLIFIERS (ELECTRONIC); ANODES; MATHEMATICAL MODELS; PHOTONS;

RADIATION DETECTORS;

EID: 29144494524     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2005.856622     Document Type: Article

References (8)

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2. O. H. W. Siegmund, A. S. Tremsin, J. V. Vallerga, R. Abiad, and J. Hull, "High resolution cross strip anodes for photon counting detectors," Nucl. Instrum. Meth., vol. A504, pp. 177-181, 2003.
3. A. S. Tremsin, O. H. W. Siegmund, J. V. Vallerga, J. S. Hull, and R. Abiad, "Cross strip readouts for photon counting detectors with high spatial and temporal resolution," IEEE Trans. Nucl. Sci., pt. 1, vol. 51, no. 4, pp. 1707-1711, Aug. 2004.
4. A. S. Tremsin and O. H. W. Siegmund, "Spatial distribution of electron cloud footprints from microchannel plates: Measurements and modeling," Rev. Sci. Instr., vol. 70, pp. 3282-3288, 1999.
5. A. S. Tremsin and O. H. W. Siegmund, "Charge cloud asymmetry in detectors with biased MCPs," Proc. SPIE, vol. 4497, pp. 127-138, 2001.
6. J. V. Vallerga, O. H. W. Siegmund, J. Dalcomo, and P. N. Jelinsky, "High-resolution (<10-μm) photon-counting intensified CCD," Proc. SPIE, vol. 3019, pp. 156-167, 1997.
7. S. H. Baik, S. K. Park, C. J. Kim, Y. S. Seo, and Y. J. Kang, "New centroid detection algorithm for the Shack-Hartmann wavefront sensor," Proc. SPIE, vol. 4926, pp. 251-260, 2002.
8. A. S. Tremsin, J. V. Vallerga, O. H. W. Siegmund, and J. S. Hull, "Centroiding algorithms and spatial resolution of photon counting detectors with cross strip anodes," Proc. SPIE, vol. 5164, pp. 113-124, 2003.