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Volumn 19, Issue 1, 2006, Pages 138-142

Structural and electrical properties of AuPd/Mo bi-layer films for transition edge sensors

Author keywords

[No Author keywords available]

Indexed keywords

GRAIN BOUNDARIES; METALLIC FILMS; SENSORS; SUPERCONDUCTING TRANSITION TEMPERATURE; X RAY ANALYSIS;

EID: 29144483912     PISSN: 09532048     EISSN: 13616668     Source Type: Journal    
DOI: 10.1088/0953-2048/19/1/023     Document Type: Article
Times cited : (18)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.