|
Volumn 19, Issue 1, 2006, Pages 138-142
|
Structural and electrical properties of AuPd/Mo bi-layer films for transition edge sensors
|
Author keywords
[No Author keywords available]
|
Indexed keywords
GRAIN BOUNDARIES;
METALLIC FILMS;
SENSORS;
SUPERCONDUCTING TRANSITION TEMPERATURE;
X RAY ANALYSIS;
BI-LAYER SENSORS;
EDGE SENSORS;
TRANSITION WIDTH;
GOLD COMPOUNDS;
|
EID: 29144483912
PISSN: 09532048
EISSN: 13616668
Source Type: Journal
DOI: 10.1088/0953-2048/19/1/023 Document Type: Article |
Times cited : (18)
|
References (15)
|