메뉴 건너뛰기




Volumn 98, Issue 11, 2005, Pages

Depth profile of strain and composition in SiGe dot multilayers by microscopic phonon Raman spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

GE-GE PHONON MODES; LASER PROBES; LOCAL HEATING; UNCORRELATED ISLANDS;

EID: 29144476549     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2140078     Document Type: Article
Times cited : (9)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.