Two improved algorithms with which to obtain contoured windows for fringe patterns generated by electronic speckle-pattern interferometry

Applied Optics

Volumn 44, Issue 33, 2005, Pages 7050-7054

  Yu, Qifeng ^a   Yang, Xia ^a   Fu, Sihua ^a   Sun, Xiangyi ^a  

^a NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; HOLOGRAPHIC INTERFEROMETRY; NATURAL FREQUENCIES; SPECKLE; SPURIOUS SIGNAL NOISE;

ELECTRONIC SPECKLE-PATTERN INTERFEROMETRY; FRINGE INTENSITY; FRINGE PATTERNS;

MOIRE FRINGES;

ALGORITHM; ARTICLE; AUTOMATED PATTERN RECOGNITION; COMPARATIVE STUDY; EVALUATION; IMAGE ENHANCEMENT; INFORMATION PROCESSING; INTERFEROMETRY; METHODOLOGY; REFRACTOMETRY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; SIGNAL PROCESSING;

ALGORITHMS; DATA COMPRESSION; IMAGE ENHANCEMENT; INTERFEROMETRY; PATTERN RECOGNITION, AUTOMATED; REFRACTOMETRY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SIGNAL PROCESSING, COMPUTER-ASSISTED;

EID: 29144475313     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.44.007050     Document Type: Article

References (11)

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